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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

Author(s)/Editor(s): Cher Ming Tan, Wei Li - | Size: 3 MB | Format: PDF | Quality: Unspecified | Year: 2013 | pages: 160 | ISBN: 1447126416


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This book offers a thorough understanding of the applications of finite element method (FEM) to reliability modeling and an appreciation of the strengths and weaknesses of various numerical models for interconnect reliability.


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